搜索包含 Reliability Analysis Center (U.S.) 的图书 - 暨南大学图书馆

大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Reliability Analysis Center (U.S.) 的图书(共4686本)

	The competitive advantage of industrial districts theoretical and empirical analysis 0 索取号：F4/E20001 作者：出版社：New York : Physica-Verlag, 2000.		Innovation and research policies : an international comparative analysis 0 索取号：F019.6/E992 作者：出版社：Northampton, MA : Edward Elgar, 1999.
	Image processing, analysis, and machine vision 0 索取号：TP3/E991 作者：Sonka、 Milan.、Hlavac、 Vaclav.、Boyle、 Roger.、出版社：London ; New York : Chapman & Hall Computing, 1993.		Data systems and management : an introduction to systems analysis and design 0 索取号：TP3/E9017.2 作者：Kindred、 Alton R.、 1922-、出版社：Englewood Cliffs, N.J. : Prentice-Hall, 1980.
	Computer systems reliability 0 索取号：TP3/E8017 作者：Bunyan、C.J.、Bunyan、 C. J.、Infotech.、出版社：Maidenhead : Berkshire Infotech Information Ltd., 1974.		Successful data processing system analysis 0 索取号：TP274.23/E801 作者：Gildersleeve、 Thomas Robert.、出版社：Englewood Cliffs, N.J. : Prentice-Hall, 1978.
	Computational methods for data analysis 0 索取号：TP274.23/E802 作者：Chambers、 John M.、出版社：New York : Wiley, 1977.		Data processing systems analysis and design 0 索取号：TP274.23/E803.2 作者：Condon、 Robert J.、 1934-、出版社：Virginia Reston, Va. : Reston Pub. Co., 1978.
	Computer-aided data analysis : a practical guide 0 索取号：TP274/E901 作者：Green、 William R.、出版社：New York : John Wiley & Son Wiley, 1985.		Computer-aided analysis and design of linear control systems 0 索取号：TP273/E992 作者：Jamshidi、 Mohammad.、Tarokh、 Mahmoud.、Shafai、 Bahram.、出版社：Englewood Cliffs, N.J. : Prentice Hall, 1992.
	Introduction to control system analysis and design 0 索取号：TP273/E9015.2 作者：Hale、 Francis J.、出版社：Englewood Cliffs, N.J. : Prentice Hall, 1988.		Linear control system analysis and design : conventional and modern 0 索取号：TP273/E20001.2 作者：D'Azzo、 John Joachim.、Houpis、 Constantine H.、 joint author.、出版社：New York : McGraw-Hill, 1981.
	Autotestcon '85, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing 0 索取号：TP216-53/E901/1985 作者：IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.		Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 0 索取号：TP216-53/E902/1983 作者：出版社：N.J. Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1983.
	Autotestcon '82, October 12-14 : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio 0 索取号：TP216-53/E901/1982 作者：IEEE International Automatic Testing Conference (1982 : Dayton、 Ohio)、Institute of Electrical and Electronic Engineers.、出版社：New York, N.Y. (345 E. 47th St., New York 10017) : IEEE, c1982.		Automated structural analysis: an introduction 0 索取号：TP202/E801 作者：Spillers、 William R.、 1934-、出版社：New York, Pergamon Press [1972]

	The competitive advantage of industrial districts theoretical and empirical analysis 0 索取号：F4/E20001 作者：出版社：New York : Physica-Verlag, 2000.		Innovation and research policies : an international comparative analysis 0 索取号：F019.6/E992 作者：出版社：Northampton, MA : Edward Elgar, 1999.
	Image processing, analysis, and machine vision 0 索取号：TP3/E991 作者：Sonka、 Milan.、Hlavac、 Vaclav.、Boyle、 Roger.、出版社：London ; New York : Chapman & Hall Computing, 1993.		Data systems and management : an introduction to systems analysis and design 0 索取号：TP3/E9017.2 作者：Kindred、 Alton R.、 1922-、出版社：Englewood Cliffs, N.J. : Prentice-Hall, 1980.
	Computer systems reliability 0 索取号：TP3/E8017 作者：Bunyan、C.J.、Bunyan、 C. J.、Infotech.、出版社：Maidenhead : Berkshire Infotech Information Ltd., 1974.		Successful data processing system analysis 0 索取号：TP274.23/E801 作者：Gildersleeve、 Thomas Robert.、出版社：Englewood Cliffs, N.J. : Prentice-Hall, 1978.
	Computational methods for data analysis 0 索取号：TP274.23/E802 作者：Chambers、 John M.、出版社：New York : Wiley, 1977.		Data processing systems analysis and design 0 索取号：TP274.23/E803.2 作者：Condon、 Robert J.、 1934-、出版社：Virginia Reston, Va. : Reston Pub. Co., 1978.
	Computer-aided data analysis : a practical guide 0 索取号：TP274/E901 作者：Green、 William R.、出版社：New York : John Wiley & Son Wiley, 1985.		Computer-aided analysis and design of linear control systems 0 索取号：TP273/E992 作者：Jamshidi、 Mohammad.、Tarokh、 Mahmoud.、Shafai、 Bahram.、出版社：Englewood Cliffs, N.J. : Prentice Hall, 1992.
	Introduction to control system analysis and design 0 索取号：TP273/E9015.2 作者：Hale、 Francis J.、出版社：Englewood Cliffs, N.J. : Prentice Hall, 1988.		Linear control system analysis and design : conventional and modern 0 索取号：TP273/E20001.2 作者：D'Azzo、 John Joachim.、Houpis、 Constantine H.、 joint author.、出版社：New York : McGraw-Hill, 1981.
	Autotestcon '85, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing 0 索取号：TP216-53/E901/1985 作者：IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.		Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 0 索取号：TP216-53/E902/1983 作者：出版社：N.J. Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1983.
	Autotestcon '82, October 12-14 : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio 0 索取号：TP216-53/E901/1982 作者：IEEE International Automatic Testing Conference (1982 : Dayton、 Ohio)、Institute of Electrical and Electronic Engineers.、出版社：New York, N.Y. (345 E. 47th St., New York 10017) : IEEE, c1982.		Automated structural analysis: an introduction 0 索取号：TP202/E801 作者：Spillers、 William R.、 1934-、出版社：New York, Pergamon Press [1972]